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Mr. Ibrahim Cisse, a suma cum laude, May 2004,
has been selected as one of the
finalists for the APS LeRoy Apker
Award 2004, the most prestige
award to be given to an undergraduate researcher. This award offers
a cash award of $2,000 to the recipient and the department
that nominates this candidate, Physics-NCCU.
Ibrahim has been accepted to a graduate program at the University
of Illinois at Urbana-Champaign under a full fellowship. |
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InAs/GaAs QUANTUM RING
IN ENERGY DEPENDENT PARTICLE EFFECTIVE MASS APPROXIMATION
Taqwanda Parson
Faculty Mentor: Dr. Igor Filikhin, Dr. Branislav Vlahovic
Three-dimensional InAs/GaAs quantum ring was studied under the energy
dependent quasi-particle effective mass approximation. The confined
energy problem was solved numerically by the finite element kp-perturbation
method in a single subband approach. The influence of the quantum ring
geometry on energy states and the electron effective mass ware investigated.
The limits of applicability of the considered model are discussed.
InAs/GaAs
QUANTUM RING IN ENERGY DEPENDENT PARTICLE EFFECTIVE MASS APPROXIMATION(.PDF)
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PULSED LASER DEPOSITION
OF MICROCRYSTALLINE SILICON
Justice McConnell
Faculty Mentor: Dr. Branislav Vlahovic
Microcrystalline silicon p-i-n solar cells are being proposed as the
bottom cell in a-Si/µc-Si tandem solar cells for improved red
absorption in the solar spectrum [1,2]. Thin film deposition of ?c-Si
gained popularity after the report of ?c-Si:H single cells having a
photo-stable conversion efficiency as high as 8 percent, with a short
circuit current density over 25 mA/cm2. As per a recent modeling, efficiency
as high as 16 percent with a short circuit current density of 33.5 mA/cm2
for single junction ?c-Si cells can be obtained for an optimum grain
size of 1 µm and film thickness of 10 µm[3]. Fabrication
of such a cell followed by tandem configuration with a-Si would greatly
fulfill the goal of finding an efficient renewable energy source.
PULSED
LASER DEPOSITION OF MICROCRYSTALLINE SILICON(.PDF)
PULSED
LASER DEPOSITION OF MICROCRYSTALLINE SILICON FIGURE(.PDF)
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NUMERICAL SIMULATION OF ELECTRONIC PROPERTIES IN QUANTUM DOT
HETEROSTRUCTURES
Misty L. Green
Faculty Mentors: Dr. B. Vlahovic, Dr. I. Filikhin, and Dr. K Wang
A confined structure in all three dimensions leads to carrier’s
discrete energy level spectrum in quantum dots. This property has profound
impact on many applications, such as single electron transistors, quantum
dot laser, high efficiency photovoltaic cells, information storage etc.
A finite element method is utilized to model the residual stress distribution.
The effect of residual stress on the electronic and optical properties
is studied. This is accomplished by incorporating both the valence subbands
and the strain-induced potential field into Schrodinger equation. A
finite-difference method was applied to solve the equation system. The
density of states is obtained from the spectrum of the eigenstates.
The discrete eigenstate distributions for both with and without residual
stress are compared. The effect of the quantum dot size and geometry
to the energy state distribution is discussed.
NUMERICAL
SIMULATION OF ELECTRONIC PROPERTIES IN QUANTUM DOT HETEROSTRUCTURES(.PDF)
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PRECISION MEASUREMENT
OF LOW LOSS WINDOW MATERIALS
Kiron Subaro
Faculty Mentor: Dr. Jyotsna M. Dutta
MA technique for measuring complex dielectric permittivity in the 118-178
GHz frequency range is suggested. The combination of a high-quality
Fabry-Perot resonator, excited by a BWO-generator, with the great processing
capability of a sensitive receiver, based on the Tektronix 2782 spectrum
analyzer (using the WM782 (F-G) harmonic mixers), opens the possibility
of a new measuring technique.
The dielectric losses are investigated on various materials, which include
sapphire, high resistivity silicon, boron nitride, and CVD grown diamonds.
Out of various techniques, Fabry-Perot resonator method has proven to
be most convenient and accurate one. It provides the accuracy of the
refractive index value close to 10-4 and scope to measure loss tangent
(tand) value close to 10-6. Measurement scheme is described and some
measurement values are reported.
PRECISION
MEASUREMENT OF LOW LOSS WINDOW MATERIALS(.MS
Word)
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NUMERICAL MODELING
OF RESIDUAL STRESSES AND THEIR EFFECTS ON THE ELECTRONIC AND OPTICAL
PROPERTIES OF QUANTUM DOT SOLAR CELLS
Marcia Archibald
Faculty Mentor: Dr. Branislav Vlahovic
Quantum dots have been proposed as one of the promising technologies
for solar cells that can provide a much higher efficiency. They are
usually fabricated by growing nanometer sized semiconductor materials
on various substrates. Due to differences in thermoelastic properties
between quantum dots and the substrate materials, residual stresses
will be generated in the quantum dots. The residual stresses will cause
defects to be generated in the devices and consequently affect the electronic
and optical properties. The finite element method has been applied to
model the distribution of the residual stresses in quantum dots. The
effects of the size, geometry, and fabrication temperature were investigated.
The results provide further information for studying the effects of
quantum dots on the electronic and optical properties of the solar cells.
NUMERICAL
MODELING OF RESIDUAL STRESSES AND THEIR EFFECTS ON THE ELECTRONIC AND
OPTICAL PROPERTIES OF QUANTUM DOT SOLAR CELLS(.MS
Word)
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RECRYSTALLIZATION OF
AMORPHOUS Si BY LASER IRRADIATION
Justice McConnell
Faculty Mentor: Dr. Branislav Vlahovic Dr. and Jyotsna Dutta
Thin a-Si:H films, with a thickness of 1µm, with different hydrogen
concentrations, prepared by hot wire deposition were crystallized by
514,5 nm cw Ar ion laser radiation, with a power density between 150
and 270 kW/cm2. The crystallization was continuously monitored by Raman
spectroscopy for exposures up to hours. The analysis of the crystallization
process using Johnson-Mehl phenomological equations showed an apparent
crystallization energy of around 0.5 eV and low dimensional crystal
growth. The mean value of the crystal size decreases with increasing
irradiation energy and initial hydrogen content and varies between 3
and 6 nm.
RECRYSTALLIZATION
OF AMORPHOUS Si BY LASER IRRADIATION(.MS
Word)
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© 2004 Department of Physics ! All Rights Reserved. |